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X-RAYS of Balenciaga, Chanel, Dior and Givenchy

Start Date 06 February 2019
End Date 16 February 2019
Venue The Museum at FIT
Location New York, USA
Curator A collaboration by the students of FIT’s Fashion Design MFA program and The Museum at FIT

X-RAYS of Balenciaga, Chanel, Dior, and Givenchy is the result of a collaboration between the students of FIT’s Fashion Design MFA program and The Museum at FIT. The project is part of a course titled “Fashion Creation 3—Design Archaeology,” which centers on the concept that in order to move design forward, it is of utmost value to know where it has been.

The students were divided into four groups, and then each group was tasked with producing a replica of a couture garment from a leading fashion house: Balenciaga, Chanel, Dior, or Givenchy. The original garments, housed in The Museum at FIT collection, were carefully researched by the students. In addition to creating the line-for-line replicas, the students gained a deep understanding of the brand’s heritage. They then developed a contemporary, technology-driven collection.

The display of process-based design work highlights each student’s personal development, resulting in a fully realized look and an advertorial that completes their vision and projects a new direction for each house.